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[ITES]SiC Brochure Download

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Contents

Bipolar Degradation Simulator for R&D

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Numerical analysis of correlation between UV irradiation and current injection on bipolar degradation in PiN diodes

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How to simulate bipolar degradation by UV irradiation with high accuracy

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Early Detection of Bar-Shaped 1SSF before Expansion by PL Imaging

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Accuracy of EVC Method for the PiNDiode Pattern on SiC Epi-Wafer

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Comparison of conventional chip burn-in and E-V-C method

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Quantification of correlation between forward bias and UV irradiation

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