[ITES]SiC Brochure Download

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Contents

Quantitative Simulation of Bipolar Degradation in 4H-SiC Using UV Pulsed Laser

Bipolar Degradation Simulator for R&D

Bipolar Degradation Simulator for SiC wafer

Comparison of conventional chip burn-in and E-V-C method

Quantification of correlation between forward bias and UV irradiation